Glass Substrate Inspection Device "Optics Glass AOI"
High-sensitivity and high-speed inspection of large glass substrates.
This is an inline high-speed inspection system for large glass products such as glass for FPD. It detects a wide variety of defects on the surface, interior, and edges of the glass with high sensitivity. Options for thickness measurement, length measurement, crack detection, and waviness detection are also available.
- Company：クボテック
- Price：Other
